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Test, Measurement & Control

The Test, Measurement & Control family includes devices, equipment and systems that are used to acquire/generate signals, measure and interpret data content, and control and command electrical devices.
Control System Components (23 Products, 727 Companies)
The control system components section covers all types of control products, counters and timers. Also included are a number of devices that are used to control devices; namely, joysticks, trackballs, controllers, programmers and positioners.
Data Acquisition System Components (19 Products, 531 Companies)
The data acquisition system components includes devices, boards and equipment which collects information from external sources or sensors, and converts the data into an analog/digital form for further processing or signal conditioning.
Test & Measurement Equipment & Accessories (114 Products, 1287 Companies)
The test & measurement equipment & accessories section lists an aggregate of instruments and tools used to test, detect, measure, probe, analyze, calibrate, and monitor data in systems, in the laboratory and other testing environments.

Recent Articles for Test, Measurement & Control:
What’s It Worth: Simpson Electric Company Testers
The Simpson Electric Company has been providing the service industry, military, aerospace and aviation, and industrial manufacturing companies with . . .
6-GHz sig gens boast top specs
In applications from radar to consumer wireless, you need signal generators to provide the purest, most precise signals so . . .
USB daq module suits strain, bridge apps
The compact, USB-powered DT9838 acquisition module offers high-speed performance for strain, load, pressure, and other bridge-based measurements. Able to . . .
USB scopes have top sampling, memory
The six PicoScope 6000 Series USB oscilloscopes are said to have the highest sampling rates and deepest memories of . . .
ENOB of Digital Oscilloscope
The effective number of bits (ENOB) is a way of quantifying the quality of an analog to digital conversion. . . .
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